Bayesian Estimation of the Odd Lindley Exponentiated Exponential Distribution: Applications in-Reliability
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Date
2024-03
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STATISTICS, OPTIMIZATION AND INFORMATION COMPUTING
Abstract
In this work, we investigate the estimation of the unknown parameters and the reliability characteristics of the Odd Lindley Exponentiated Exponential distribution. The Bayes estimators and corresponding risks are derived using various loss functions with complete data and a gamma prior distribution. A simulation study was carried out to calculate all the results. We used Pitman’s closeness criterion and the integrated mean squared error to compare the performance of the Bayesian and maximum likelihood estimators. Finally, we illustrate ur techniques by analysing a real-life data set
Description
Vol. 12, March 2024, pp 418–431.
DOI: 10.19139/soic-2310-5070-1880